Macquarie Semiconductor and Technology on behalf of Inspire Technologies, Inc.
Broadband Patterned Wafer Defect Inspection
Date of Manufacture: 1985
Currently Configured for: 150mm
Current Equipment Status: Available
Location of Equipment: Caldwell, United States
Available date: Currently Available
DOMESTIC SALE: Only offers from US entities will be considered. Seller will not clear the equipment for export or act as Exporter of Record from the United States.
OEM: ESTEK (formerly Aeronca)
Aeronca WIS - 150 surface particle counter is at 0.5 micron sensititity .
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
Get in touch
Ask about our equipment solutions, ranging from Macquarie equipment inventory sales, sourcing programs, surplus disposition options, and direct equipment purchases.