Macquarie Semiconductor and Technology on behalf of Micron Technology, Inc. (Boise)
The images and data contained herein is owned by Macquarie and is intended for use only by potential purchasers of goods shown herein. Except for such permitted usage, no other use of the images and data is permitted and such images and data shall not be exhibited or shown in any websites or social media or for any commercial purposes without Macquarie’s written permission. Therefore, no seller of goods like the goods shown herein has any right or authority to show or exhibit any images or data shown herein.
Date of Manufacture: 2012-06-01
Currently Configured for: N/A
Current Equipment Status: Available
Location of Equipment: Boise, United States
Available date: Currently Available
Audit to verify
============== OEM Feature for reference =============
InSightTM 3DAFM is the latest generation AFM system designed to meet Critical Dimension, depth and CMP metrology requirements for 45nm and 32nm node semiconductor processes
• Lowest CD and Depth Total Measurement Uncertainty (TMU)
• Unique, Non-Destructive, 3D Metrology (LER, LWR, SWA)
• 30 wph, 9 Sites Throughput for Depth Metrology
• 12 wph, 9 Sites Throughput for CD Metrology
• Production Level Reliability and Automation
• Provides Fast Time to Data and Speeds Development Time
• Provides In-Line 3D Metrology for Gate to Improve Process Control
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
Get in touch
Ask about our equipment solutions, ranging from Macquarie equipment inventory sales, sourcing programs, surplus disposition options, and direct equipment purchases.
