Macquarie Semiconductor and Technology on behalf of Macquarie (Asia) Pte Ltd. Taiwan Branch - UMC

Micromanipulator P300J

Asset ID: 209981

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Micromanipulator

P300J

Engineering Wafer Prober

Wafer Prober

Equipment details:

Date of Manufacture:

Currently Configured for: 200mm

Current Equipment Status: Available

Location of Equipment: Hsinchu, Taiwan

Available date: Currently Available

Inspect to confirm configuration and condition

The power of the equipment is damaged and cannot be turned on.

Travel of Stage: 300 mm*300 mm

Vacuum: CDA & GN2

DUT sizes:12"

Tester Type (Used With):Wafer


P300J Features and Benefits:

• Cast base with vibration isolation interlayer: Provides stability and ruggedness

• Station single-point ground: Low current ready

• MicroTouchTM controls: Ergonomic in design with super responsive control

• Motorized 2-speed stage, theta and microscope drives: Provide ease of use with the choice of speed range for long-distance or precise positioning

• Stage/Platen/Theta drive control via MicroTouchTM controls and joystick: Multiple users have their choice of controls to fit their preference

• Station joystick includes device select, high/low speed, and “lockout” buttons: Provides full localized control. Lockout prevents inadvertent movement during testing

• Stage, Platen, Theta (300 x 300 x 50mm x 15 deg) range: Provides full wafer coverage and flexibility of setup

• 0.1 micron resolution stage, platen, and microscope drive: Supports probing of the smallest targets

• Stainless steel platen with 4-point platen leadscrew drive: Supports both magnetic and vacuum base manipulators

• Integrated dry/dark enclosure: Provides EMF shield and enclosure for low temperature chuck dryness

• Removable front wedge: Provides easy access to the chuck for loading and unloading wafers when removed, and support for additional manipulators when in place

• Microscope 100 x 100mm (X-Y), x 200mm (Z) drive range: Supports large die and multi-site probe cards

• High force chuck/theta post assembly: Supports high pincount probe card pressures

• Station plumbed and wired to accept -55 to +300 degree C H1000 series thermal chuck: Set up is clean and clear for fixturing and cabling

• Vacuum quick disconnect and Triaxial strain relief brackets: Provide convenient, strain relieved connections


Full range of accessories and options available including:

Probe card holders, Light Tight Enclosures, Thermal Chucks, Video accessories, Manual/Motorized manipulators.


Facility Requirements:

• Test station: Vacuum: 25 in-Hg

• RMC-7 controller: 85 to 265 VAC, 47-63 Hz, 2.4 Amps, typical


Test Station Dimensions (Width, Depth, Height, Weight):

• Station: 33” x 40” x 33” (84 x 102 x 84 cm), 480 lbs (218-Kg)

• RMC-7: 17.8” x 19.7” x 5.5” (45.2 x 50x 13.9cm) 24 lbs (11-Kg)


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The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.


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