Macquarie Semiconductor and Technology on behalf of ON Semiconductor Czech Republic s.r.o.

KLA-Tencor Corp. Candela 8520

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Asset ID: 229430

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KLA-Tencor Corp.

Candela 8520

Wafer Inspection Equipment

Metrology Equipment

Equipment details:

Date of Manufacture: 2022-12-01

Currently Configured for: 150mm

Current Equipment Status: Available

Location of Equipment: Czech Republic

Available date: Currently Available


Description:

Model #:KLA Candela 8520
Serial Number:
Install Date:
PROMIS kód:
DescriptionRemarks
1Voltage: 208/230 +10% VAC, 1-phase
2Power Consumption: 1.1kVA
3Power frequency: 50/60Hz
4Maximum power: 2.3kVA
5Wafer Size 6 and  8” Wafer
6Wafer Thickness 350μm ~ 1100μm
7Wafer Carrier 2 FUP 6 and 8
8Wafer Mapping Micro Optical Sensor 
9 SECS-GEM Interfaces
10CDA
Pressure: 100 psi / 689 KPa (± 10% range).
Flow: 2 SCFM / 80 L/min (± 10% range).
AMC: maximum concentration of Volatile Organic Compounds (VOC) must be less than 150 ng/l.
Anions must be less than 14 ng/l. Cations must be less than 10 ng/l.
 Moisture Content: less than 20 PPM at 1.0 atm, corresponding to a dewpoint of -30° Celsius (-22°F).
11Vacuum
Pressure: -680 mm Hg / -90 KPa (± 10% range).
Flow: 0.64 SCFM / 18 L/min (± 10% range).
12The Candela 85XX uses two lasers 
405 nm wavelength, 60 mW power (Class IIIb per CDRH 21CFR 1040).
355 nm wavelength, 20 mW power (Class IIIb per CDRH 21CFR 1040).
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Product images

The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.


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