Macquarie Semiconductor and Technology on behalf of Inspire Technologies, Inc.

Estek Automation SDN BHD WIS-150

Asset ID: 210770

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Estek Automation SDN BHD

WIS-150

Broadband Patterned Wafer Defect Inspection

Metrology Equipment

Equipment details:

Date of Manufacture: 1985

Currently Configured for: 150mm

Current Equipment Status: Available

Location of Equipment: Caldwell, United States

Available date: Currently Available

OEM: ESTEK (formerly Aeronca

MODEL: WIS-150


 Aeronca WIS - 150 surface particle counter is at 0.5 micron sensititity .

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The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.


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