Macquarie Semiconductor and Technology on behalf of Micron Memory Japan, G.K. (F15)
Date of Manufacture: Mar. 2004
Currently Configured for: 300mm
Current Equipment Status: Incoming
Asset HDD not included
Location of Equipment: Hiroshima, Japan
Available date: 9/3/2022
Tool is operating in the clean room.
‘Equipment is located in Micron’s cleanroom and buyer is responsible for deinstallation, packaging, crating, loading and shipping’
No shipping kits will be provided by Fab15. Buyer will need to supply with shipping kits for equipment rigging.
The OEM's de-installation amount for $2,175.13 USD.
The OEM's shipping kits' amount for USD $1,093.84.
A HARD DISK DRIVE WILL BE REMOVED FROM TOOL.
Missing or damaged parts: Fab15 confirmed there were no missing or damaged parts.
Overall accuracy：within 4μm
Stage positioning accuracy: 2μm / φ300mm
Low noise chuck
Mini-Environment *Option
Connected to an Agilent 4073A Tester.
Temperature range: 15℃～150℃
Configured for Ambient/Hot temperatures.
To operate up to 150℃.
No Chiller equipped.
Chuck TYPE: Low Noise Chuck.
Chuck MFG : MAR-04
Tester Inter Face: Connected on GP-IB between Prober and Tester.
Tool corresponds with Tester on GP-IB.
Camera: Cognex Insight 1742
Prober Feature
X,Y Overall Accuracy：±2.0µm (Temp Stability ±1℃
X,Y Stage Accuracy：±1.0µm
Z Axis Stroke(Applicable stroke)：37mm
Z Axis Control Accuracy：±2µm
Stage Durability：200kgf
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
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