Macquarie Semiconductor and Technology on behalf of Micron Memory Japan, G.K. (F15)
Date of Manufacture:
Currently Configured for: To be determined
Current Equipment Status: Available
Asset HDD not included
Location of Equipment: Hiroshima, Japan
Available date: 3/5/2022
PROBE 15-3AGIL_4082_FINAL AGILENT Final Param
4082A Parametric Test System
A high-throughput parametric test system with advanced parallel testing capabilities, a high-speed capacitance measurement option, and SEMI standards.
Model-4082A, Linux, RHEL5.3, SPECS-3.10-14, Rev5.15-7, Firmware-3.29, SMU1,2, MP-AMU308, Pin Cards-48, Cap Meter HSCMU, DVM-3458A
• Source Monitor Unit selectable from medium power (MPSMU), high power (HPSMU) and high resolution (HRSMU)
• Synchronous and asynchronous parallel test can improve the throughput with VMT (Virtual Multiple Testhead) software.
• 1 fA and 0.1 µV measurement resolution
• Optional HS-CMU (High Speed Capacitance Measurement Unit)
• Optional ring oscillator measurement
Primary Test Target
High volume manufacturing for semiconductor devices, especially using Keysight/Agilent 4070 testers.
DC current, DC voltage, capacitance and conductance, impedance, and differential voltage.
Key Measurement Capabilities
• DC measurements (spot, sweep, pulse bias, pulse sweep)
• Capacitance, conductance and impedance measurements
• Two terminal differential voltage measurements
• Switching matrix
Other Available Integrations
• Spectrum/signal analyzer
• WGFMU (Waveform Generator Fast Measurement Unit)
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