Macquarie Semiconductor and Technology on behalf of IBM Corporation
Date of Manufacture:
Currently Configured for: To be determined
Current Equipment Status: Available
Location of Equipment: Yorktown Heights, United States
Available date: Currently Available
JEOL 2010F TEM is a transmission electron microscope with a field emission gun and 200 keV maximum accelerating voltage.
installed at IBM T. J. Watson Research Center in Yorktown Heights, N
- functioning in Yorktown for in-situ TEM experiments.
- high tilt pole piece to enable in-situ sample holders.
FE gun wait to maintenance, otherwise the tool was fully functional.
several Gatan specialty holders that were purchased for the tool and never used:
(cooling, heating and biasing holders)
EDAX energy dispersive x-ray system and Gatan Tridium EELS system.
Both EDS and EELS were not installed at IBM Yorktown and are still in boxes in the lab.
Original date of purchase or date of mfg: ~2000
Type of product processed through this tool: 3 mm samples
Last Date Operated: (MM/DD/YY): ~06/2021
================================= Reference ==============================
The JEM-2100F is a multipurpose, 200 kV FE (Field Emission) analytical electron microscope. Variety of versions is provided to adapt user’s purposes. The FE electron gun (FEG) produces highly stable and bright electron probe that is never achieved with conventional thermionic electron gun. This feature is essential for ultrahigh resolution in scanning transmission microscopy and in an analysis of a nano-scaled sample. Various analytical instruments and/or cameras such as EDS (Energy Dispersive X-ray Spectrometer) or EELS (electron energy loss spectrometer) or CCD cameras are ready for integration with a PC system of the microscope control.
|High specimen tilt|
|Point||0.19 nm||0.23 nm||0.25 nm||0.27 nm||0.31 nm|
|Lattice||0.1 nm||0.1 nm||0.1 nm||0.14 nm||0.14 nm|
|Acc. Voltage*2||160 kV，200 kV*1|
|Minimum step||50 V|
|Step size||50 V minimum|
|Brightness||≧4×108 A / cm2 / sr|
|Pressure||×10-8 Pa order|
|Probe current||0.5 nA for 1 nm probe|
|Optical parameters for objective lenses|
|Focal length||1.9 mm||2.3 mm||2.7 mm||2.8 mm||3.9 mm|
|Spherical aber. coef.||0.5 mm||1.0 mm||1.4 mm||2.0 mm||3.3 mm|
|Chromatic aber. coef.||1.1 mm||1.4 mm||1.8 mm||2.1 mm||3.0 mm|
|Minimum focal step||1.0 nm||1.4 nm||1.8 nm||2.0 nm||5.2 nm|
|Spot Size (diameter)|
|TEM mode||2 to 5 nm||７ to 30 nm|
|EDS mode||0.5 to 2.4 nm||-||-||4 to 20 nm|
|CBD mode||1.0 to 2.4 nm||-|
|Parameters for convergent beam diffraction|
|Convergence angle||1.5 to 20 mrad||-||-|
|MAG mode||×2,000 to 1,500,000||×1,500 to 1,200,000||×1,200 to 1,000,000||×1,000 to 800,000|
|LOW MAG mode||×50 to 6,000||×50 to 2,000|
|SA MAG mode||×8,000 to 800,000||×6,000 to 600,000||×5,000 to 600,000||×5,000 to 400,000|
|SA diffraction(mm)||80 to 2,000||100 to 2,500||150 to 3,000|
|HD diffraction(m)||4 to 80|
|HR diffraction*2||333 mm|
|X,Y||2 mm||2 mm||2 mm||2 mm||2 mm|
|Z||±0.1 mm||±0.2 mm||±0.2 mm|
|X / Y*3||±25/±25°||±35/±30°||±42/±30°||±15/±10°||±38/±30°|
|Bright-field lattice resolution||0.2 nm||-||-|
|Solid angle(30mm2)||0.13 sr.||0.13 sr.||0.13 sr.||*8||0.09 sr|
|Solid angle(50mm2)*7||0.24 sr.||0.28 sr.||0.23 sr.|
*1 : Select either configuration when ordering the JEM-2100F.
*2 : 80 kV, 100 kV and 120 kV are possible with the optional short-circuit switches for the accelerating tube.
*3 : With the Specimen Tilting Holder (EM-31630).
*4 : With the High Tilt Specimen Retainer (EM-21310).
*5 : With the optional scanning image observation device.
*6 : With the optional EDS detector.
*7 : With the JEOL 50 mm2 EDS detector.
*8 : EDS detectors are unavailable.
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
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