Macquarie Semiconductor and Technology on behalf of Micron Memory Japan, G.K. (F15)
Date of Manufacture: Nov. 2013
Currently Configured for: 300mm
Current Equipment Status: Incoming
Asset HDD not included
Location of Equipment: Hiroshima, Japan
Available date: Currently Available
Tool is operating in the clean room.
Shipping brackets and kits will need to be supplied by buyer.
A Hard Disk Drive will be removed from tool.
Missing or damaged parts: Checking with Fab15.
Overall accuracy：within 4μm
Stage positioning accuracy: 2μm / φ300mm
Low noise chuck
Connected with an Agilent 4073A Tester.
Temperature range: 15℃～150℃
Configured for Ambient/Hot temperatures.
To operate up to 150℃.
No Chiller equipped.
Chuck Type: Low Noise Chuck.
Chuck MFG: NOV-13
Tester Interface: Connected on GP-IB between Prober and Tester.
Tool corresponds with Tester on GP-IB.
Camera: Cognex Insight 1742.
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
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