Macquarie Semiconductor and Technology on behalf of Micron Memory Japan, K.K. (F15)
Date of Manufacture:
Currently Configured for: N/A
Current Equipment Status: Available
Asset HDD not included
Location of Equipment: Hiroshima, Japan
Available date: Currently Available
YE Thermofisher Tecnai G2-F30
Configuration Details:
Tecnai 30ST
S/N : D297
Hight Tension : 300kV
SFEG
Resolution TEM point : 0.205nm
Resolution HRSTEM : 0.16nm
Camera : Gatan 794 CCD
STEM Detector : BF/DF/HAADF
EELS : Gatan Tridiem
EDAX
Lorentz lens
Tomography STEM/TEM
Biprism
Software
OS : Windows XP sp3
Tecnai 3.1.2
TIA 3.2 SP6
Digital Micrograph 3.9.5 for GMA 1.4.5
Objective Lens Type : ??
Essential specifications
Electron source
• Flexible high tension (50, 100, 150, 200, 250, 300 kV and values in between)
• Schottky Field emitter with high maximum beam current (> 100 nA)
• High probe current (0.6 nA in a 1 nm spot, 15 nA in a 10 nm spot)
• Small energy spread (0.8 eV or less)
• Spot drift < 1 nm/minute
Imaging
• Patented TWIN, S-TWIN and U-TWIN objective lenses
• Coma-free alignment for high resolution objective-lens centering
• Ranged, rotation-free magnification and diffraction series
• Magnification reproducible within ± 1.5%
• Embedded CCD/energy filter
• Lorentz lens for field free imaging for magnetic field visualization (optional)
STEM
• Fully digital scan system
• Bright Field and Annular Dark Field mode
• High resolution STEM with HAADF detector
Microanalysis
• Excellent EDX in-hole performance (< 1% hole count)
• Low system background in EDX (< 1% spurious peaks)
• High P/B ratio (Fiori number) > 4000
• Embedding of EDX, PEELS and energy filter
• Spectrum imaging with multiple detectors
Specimen stage
• Fully computer-controlled, eucentric side-entry, high stability CompuStage
• Maximized tilts for any X,Y,Z, α and β combination
• Choice of a variety of specimen holders
• X, Y movement ± 1 mm, Z movement ± 0.375 mm; specimen size 3 mm
• Specimen recall reproducibility: ≤ 0.3 μm (after movement of 300 μm in x and y) and ≤ 0.1 (α tilt)
• Drift ≤ 0.5 nm/minute with a standard holder attainable
Vacuum
• Fully interlocked differentially pumped column
• Clean vacuum system with turbo molecular pump, prepumping column, gun and specimen airlock
• 150 l/s Ion Getter Pump on specimen area • Liner tubes pumped by additional Ion Getter Pump
• Ultra-high vacuum for contamination-free observation
• Vacuum levels: specimen chamber < 2.7 × 10-5 Pa ; gun < 5 × 10-7 Pa
• Fast airlock pumping times: user selectable down to < 1 min
• Plate camera exchange without switching off high tension or emitter
Software and control
• Operations system: Windows® XP • Remote operation (optional)
• Motorized apertures (optional) • Scripting software (optional)
• Xplore3D™: FEI's intelligent tomography solution for TEM and STEM (optional)
• TrueImage: FEI's patented focal series acquisition and reconstruction software package (optional)
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
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