Macquarie Semiconductor and Technology on behalf of Micron Japan, Ltd.
Date of Manufacture:
Currently Configured for: To be determined
Current Equipment Status: Available
Asset HDD not included
Location of Equipment: Hiroshima, Japan
Available date: 3/5/2022
PROBE 15-3ADV_5383_TST ADVANTEST TESTER
Advantest T5383 Feature
The T5383 provides a timely response to these trends. From front-end test for DRAM to back-end test for FLASH memory, MCP/SIP, and other devices, the T5383 provides a high-throughput solution that offers flexible support for increasingly fast and versatile memory devices. With greater test resources than those of the T5377S, the T5383 supports greater device pin counts, and allows for higher levels of parallelism: up to 384 devices, 1.5 times greater than that of its predecessor. The T5383 operates at 286 MHz/572 Mbps, double the speed of T5377S, making it the industry's fastest offering in this product category. This increased speed translates into shorter test times, as well as higher fault coverage, including Known Good Die applications. Further, enhanced memory repair analyzer hardware (the MRA4ev3 and DualAFM option) delivers approximately double the throughput of previous products.
T5383 Major Specifications
Target Devices: DRAM, SDRAM, DDR devices, SRAM and flash memory, EPROM, etc.
Simultaneous Testing: Up to 384 devices per system
Test Speed: 286 MHz/572 Mbps (in DDR mode)
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
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