Macquarie Semiconductor and Technology on behalf of Micron Technology, Inc. (VA)
Date of Manufacture: TBD
Currently Configured for: To be determined
Current Equipment Status: Available
Asset HDD not included
Location of Equipment: Manassas, United States
Available date: Currently Available
Tool Status: In Production.
Configuration. Audit to verify.
No pictures provided. Please inspect to confirm.
Other Missing or damaged parts: Not reported. Please inspect to confirm.
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T5585 Memory Test System, designed for high-volume package production of memory such as DDR-SDRAM and SSRAM, with high precision testing of up to 128 devices in parallel.
Capable of testing 500 MHz Double Data Rate (DDR) in a single pass, the T5585 also incorporates the latest technology in accuracy, stability, and reliability.
By doubling the test-cell capacity of the T5581, which is Advantest's record-setting production tester, the T5585 joins production efficiency with next-generation performance for high-volume memory test.
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