Macquarie Semiconductor and Technology on behalf of Micron Memory Japan, G.K. (F15)
Date of Manufacture: November, 2006
Currently Configured for: 300mm
Current Equipment Status: Available
Asset HDD not included
Location of Equipment: Hiroshima, Japan
Available date: 9/3/2022
Tool is operating in clean room.
Shipping brackets and kits will need to be supplied by buyer.
Missing or damaged parts: Fab15 confirmed there were no missing or damaged parts.
Connected to an Agilent 4073B tester.
Temperature range: 40℃～150℃
Configured for Ambient/Hot temperatures.
To operate up to 150℃.
Chuck Type: Low Noise Chuck.
Chuck MFG: NOV-06.
Tester Interface: Connected on GP-IB between Prober and Tester.
Tool corresponds with Tester on GP-IB.
X,Y Overall Accuracy：±2.0µm (Temp Stability ±1℃
X,Y Stage Accuracy：±1.0µm
Z Axis Stroke(Applicable stroke)：37mm
Z Axis Control Accuracy：±2µm
Get in touch