Macquarie Semiconductor and Technology on behalf of Micron Technology, Inc. (Boise)
Date of Manufacture: 2005
Currently Configured for: 300mm
Current Equipment Status: Available
Asset HDD not included
Location of Equipment: Boise, United States
Available date: Currently Available
Wafer Characterization WAFS001 KLAT WAFERSITE SHAPE/FLATNESS
Status: Tool was shut down and moved to a storage location on site.
Configuration: Audit to verify.
Standard System Configuration
Double-sided interferometric flatness and shape gauge
Semi M49 mode
2mm capacitance probe emulation mode
Capacitive thickness gauging with traceable
Wafer Automation EFEM
Full Edge Grip robotic end effector and pre-aligner
Multiple Computer Processing
Windows 2000 operating system
Dual Graphical User Interfaces with flat panel monitor
And fold down keyboard
Ethernet Network Connection
High Density Media storage device
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
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