Macquarie Semiconductor and Technology on behalf of Micron Memory Japan, G.K. (F15)

Keysight / Agilent / Hewlett-Packard (HP) 4082A

Asset ID: 209107

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Keysight / Agilent / Hewlett-Packard (HP)

4082A

Parametric Tester

Automated Test Equipment (ATE)

Equipment details:

Date of Manufacture:

Currently Configured for: To be determined

Current Equipment Status: Incoming

Asset HDD not included

Location of Equipment: Hiroshima, Japan

Available date: 1/20/2023

PROBE 15-3AGIL_4082_FINAL AGILENT Final Param


4082A Parametric Test System

A high-throughput parametric test system with advanced parallel testing capabilities, a high-speed capacitance measurement option, and SEMI standards.


Key functions

• Source Monitor Unit selectable from medium power (MPSMU), high power (HPSMU) and high resolution (HRSMU)

• Synchronous and asynchronous parallel test can improve the throughput with VMT (Virtual Multiple Testhead) software.

• 1 fA and 0.1 µV measurement resolution

• Optional HS-CMU (High Speed Capacitance Measurement Unit)

• Optional ring oscillator measurement 


Primary Test Target

High volume manufacturing for semiconductor devices, especially using Keysight/Agilent 4070 testers.

Measurement Functions

DC current, DC voltage, capacitance and conductance, impedance, and differential voltage.

Key Measurement Capabilities

• DC measurements (spot, sweep, pulse bias, pulse sweep)

• Capacitance, conductance and impedance measurements

• Two terminal differential voltage measurements

• Switching matrix

Other Available Integrations

• Spectrum/signal analyzer

• WGFMU (Waveform Generator Fast Measurement Unit)

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The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.


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