Macquarie Semiconductor and Technology on behalf of Micron Memory Japan, G.K. (F15)
SEM - Critical Dimension (CD) Measurement
Date of Manufacture: 13, 03
Currently Configured for: 300mm
Current Equipment Status: Available
Asset HDD not included
Location of Equipment: Hiroshima, Japan
Available date: 12/25/2021
METROLOGY 15-3HITA_CG4100_SEMCD_01 HITACHI CG4100
A Hard Disk Drive will be removed from tool.
Other missing or damaged parts: Not reported.
Vendor:HITACHI
S/N:4187-03
VID:VID753
SW Version:35.47
Resolution:1.8nm
throughput:42wafer/h
MAM Time:2.8sec
Stage Landing Accuracy:±1μm
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
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