Agilent Technologies Inc. 41000

Equipment details:

Date of Manufacture:

Currently Configured for: To be determined

Current Equipment Status: Available

Asset HDD not included

Location of Equipment: Hiroshima, Japan

Available date: Currently Available

Agilent 41000 Parametric Tester

HARD DISK DRIVE WILL BE REMOVED FROM TOOL.

4284A will be removed from tool.

Other Missing or damaged parts: Not reported. Please inspect to confirm.

UPDATED CONFIGURATION:

1) Precision Semiconductor Parametric Analyzer

2) Femto Leakage Switch Mainflame

3) 20 Hz to 1 MHz Precision LCR Meter

4) EIA Cabinet(hight : 1620mm)

Model : 4156C

Ser No : JP10J00984

Software Revision

HOSTC : 03.05

SMUC : 04.06 

ADC : 01.00

CPU Revision : 1

4 High Resolution SMU

VSU1,VSU2,VMU1,VMU2

Model : B2200A

Ser No : JP10M00101

Switch Module(B2210A) x2

General features of 4156C

• Highly accurate laboratory bench top parameter analyzer for advanced device characterization
• 4x High-resolution SMU, 2xVSU and 2xVMU
• Fill-in-the blanks front panel operation
• Includes Desktop EasyEXPERT software for PC-based GUI instrument control

Specifications

• Four built-in high-resolution source /monitor units, two voltage source units, and two voltage monitor units
• Measurement resolutiuon: 1fA and 0.2µV
• Full Kelvin: force, sense, and guard terminals for each HRSMU
• Performs quasi-static capacitance measurements versus voltage measurements
• Automatically extracts process parameters without manually manipulating screen markers
• Measures leakage characteristics with ultra-low leakage SMUs
• Automates device characterization with integrated pulse generators and selector switches
• On-wafer reliability tests with built-in stressing modes
• Point-and-click measurements with graphical user interface
• Provides graphical data analysis capabilities with a Windows environment
• QSCV, Stress Mode, Knob-sweep, Stand-by function
• Triggering modes allow synchronized AC/DC measurements
• IBASIC user functions allow data to be plotted and analyzed

Measurement capabilities

• 1 femtoamp and 0.2 microvolt measurement resolution
• QSCV, Stress Mode, Knob-sweep, Stand-by function
• +/- 200 Volts and +/- 1 Amp High-Power SMU, Pulse Generator capabilities available by optional 41501B

Desktop EasyEXPERT software

• Same test and measurement environment for B1500A Semiconductor Device Analyzer
• Intuitive, task-oriented approach to parametric test
• Furnished with over 80 pre-defined, user-modifiable application tests
• Automatically save data to hard disk drive or any networked drive
• Offline data analysis and application test development via Desktop EasyEXPERT software

General features of B2200A

 8 guarded triaxial inputs and 6 coaxial inputs with up to 48 guarded triaxial outputs.