Macquarie Semiconductor and Technology on behalf of Micron Memory Japan, G.K. (F15)
Date of Manufacture:
Currently Configured for: To be determined
Current Equipment Status: Available
Asset HDD not included
Location of Equipment: Hiroshima, Japan
Available date: 3/5/2022
PROBE 15-3ADV_5385_TST ADVANTEST TESTER
Advantest T5385 Feature
ADVANTEST’s T5385 memory test system for DRAM wafer test delivers an unrivaled 768-DUT parallel test capacity and 533 Mbps capability for increased throughput and lowered cost of test. T5385 also delivers Known Good Die (KGD) for consumer devices, to greatly improve yields for LPDDR2 and DDR3 multi-die and stacked devices.The T5385 is enabled by hardware and software advances, including a highspeed memory repair analysis (MRA) system for DRAM and flash memory wafer test that greatly reduces test time. In fact, test times can be shortened by 30% when compared with the company’s previous model test system.
T5385/T5385ES Key Specifications
Target Devices : DRAM, SDRAM, DDR devices, SRAM, Flash memory, EPROM, etc.
Parallel Testing : T5385: Up to 768 devices / T5385ES: Up to 12 devices
Test Speed : 266 MHz/533 Mbps (in DDR mode)
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