Macquarie Semiconductor and Technology on behalf of Micron Japan, Ltd.

Olympus AL3100

Asset ID: 208492

Print spec sheet

Olympus

AL3100

Macro-Defect

Metrology Equipment

Equipment details:

Date of Manufacture: August 1, 2002

Currently Configured for: 300mm

Current Equipment Status: Available

Asset HDD not included

Location of Equipment: Hiroshima, Japan

Available date: Currently Available

PROBE - 15-3OLMP_AL3100_MACRINSP_01

Tool has been de-installed and is wrapped up in the clean room.

The tool will be shipped from Fab15 to an off-site warehouse on March 26th.

Missing or damaged parts: Confirming with Fab15 now.


PC model:NEC,FC98-NXC-20X

OS:Win XP Pro

Robot name:Rorze

Port type:TDK/TAS300TypeE

Eyepiece: x10

Object lens: x5, x10, x20, x50, x100


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The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.


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