Macquarie Semiconductor and Technology on behalf of Micron Japan, Ltd.
Date of Manufacture:
Currently Configured for: 300mm
Current Equipment Status: Available
Asset HDD not included
Location of Equipment: Hiroshima, Japan
Available date: Currently Available
PROBE 15-3ACRT_5377S_PRB
UF3000 PROBER
X,Y Overall Accuracy：±2.0µm (Temp Stability ±1℃
X,Y Stage Accuracy：±1.0µm
Z Axis Stroke(Applicable stroke)：37mm
Z Axis Control Accuracy：±2µm
Stage Durability：200kgf
Hot&COLD chuck
Chiller：SCU-600
Temp. Range：-40 to 150℃
Tool was connected with a T5377S tester before de-installation.
HINGE INCLUDED IN TOOL. MODLE: MHF6000.
NO PHOTOS PROVIDED BY FAB15 since Tool has been de-installed and is stored in an off-site warehouse.
Please inspect to collect photos.
Other missing or damaged parts: Checking with FAb15.
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
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