Macquarie Semiconductor and Technology on behalf of Micron Memory Japan, G.K. (F15)
Date of Manufacture:
Currently Configured for: N/A
Current Equipment Status: Available
Asset HDD not included
Location of Equipment: Hiroshima, Japan
Available date: Currently Available
Agilent 41000 Parametric Tester
HARD DISK DRIVE WILL BE REMOVED FROM TOOL.
4284A will be removed from tool.
Other Missing or damaged parts: Not reported. Please inspect to confirm.
1) Precision Semiconductor Parametric Analyzer
2) Femto Leakage Switch Mainflame
3) 20 Hz to 1 MHz Precision LCR Meter
4) EIA Cabinet(hight : 1620mm)
Model : 4156C
Ser No : JP10J00984
HOSTC : 03.05
SMUC : 04.06
ADC : 01.00
CPU Revision : 1
4 High Resolution SMU
Model : B2200A
Ser No : JP10M00101
Switch Module(B2210A) x2
8 guarded triaxial inputs and 6 coaxial inputs with up to 48 guarded triaxial outputs.
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
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