Macquarie Semiconductor and Technology on behalf of Micron Memory Japan, G.K. (F15)
Date of Manufacture: November, 2006
Currently Configured for: 300mm
Current Equipment Status: Available
Asset HDD not included
Location of Equipment: Hiroshima, Japan
Available date: 9/3/2022
Tool is operating in clean room.
Shipping brackets and kits will need to be supplied by buyer.
Missing or damaged parts: Fab15 confirmed there were no missing or damaged parts.
UPDATED CONFIGURATION:
Connected to an Agilent 4073B tester.
Temperature range: 40℃～150℃
Configured for Ambient/Hot temperatures.
To operate up to 150℃.
Chuck Type: Low Noise Chuck.
Chuck MFG: NOV-06.
Tester Interface: Connected on GP-IB between Prober and Tester.
Tool corresponds with Tester on GP-IB.
Prober Feature
X,Y Overall Accuracy：±2.0µm (Temp Stability ±1℃
X,Y Stage Accuracy：±1.0µm
Z Axis Stroke(Applicable stroke)：37mm
Z Axis Control Accuracy：±2µm
Stage Durability：200kgf
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
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