Macquarie Equipment Trading on behalf of Micron Memory Japan, G.K. (F15)

Agilent Technologies Inc. 41000

Asset ID: 205949

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Agilent Technologies Inc.

41000

Parametric Tester

Automated Test Equipment (ATE)

Equipment details:

Date of Manufacture:

Currently Configured for: To be determined

Current Equipment Status: Available

Asset HDD not included

Location of Equipment: Hiroshima, Japan

Available date: Currently Available

Agilent 41000 Parametric Tester


HARD DISK DRIVE WILL BE REMOVED FROM TOOL.

4284A will be removed from tool.

Other Missing or damaged parts: Not reported. Please inspect to confirm.


UPDATED CONFIGURATION:

1) Precision Semiconductor Parametric Analyzer

2) Femto Leakage Switch Mainflame

3) 20 Hz to 1 MHz Precision LCR Meter

4) EIA Cabinet(hight : 1620mm)


Model : 4156C

Ser No : JP10J00984

Software Revision

HOSTC : 03.05

SMUC : 04.06 

ADC : 01.00

CPU Revision : 1

4 High Resolution SMU

VSU1,VSU2,VMU1,VMU2


Model : B2200A

Ser No : JP10M00101

Switch Module(B2210A) x2



General features of 4156C

  • Highly accurate laboratory bench top parameter analyzer for advanced device characterization
  • 4x High-resolution SMU, 2xVSU and 2xVMU
  • Fill-in-the blanks front panel operation
  • Includes Desktop EasyEXPERT software for PC-based GUI instrument control


Specifications

  • Four built-in high-resolution source /monitor units, two voltage source units, and two voltage monitor units
  • Measurement resolutiuon: 1fA and 0.2µV
  • Full Kelvin: force, sense, and guard terminals for each HRSMU
  • Performs quasi-static capacitance measurements versus voltage measurements
  • Automatically extracts process parameters without manually manipulating screen markers
  • Measures leakage characteristics with ultra-low leakage SMUs
  • Automates device characterization with integrated pulse generators and selector switches
  • On-wafer reliability tests with built-in stressing modes
  • Point-and-click measurements with graphical user interface
  • Provides graphical data analysis capabilities with a Windows environment
  • QSCV, Stress Mode, Knob-sweep, Stand-by function
  • Triggering modes allow synchronized AC/DC measurements
  • IBASIC user functions allow data to be plotted and analyzed


Measurement capabilities

  • 1 femtoamp and 0.2 microvolt measurement resolution
  • QSCV, Stress Mode, Knob-sweep, Stand-by function
  • +/- 200 Volts and +/- 1 Amp High-Power SMU, Pulse Generator capabilities available by optional 41501B

Desktop EasyEXPERT software

  • Same test and measurement environment for B1500A Semiconductor Device Analyzer
  • Intuitive, task-oriented approach to parametric test
  • Furnished with over 80 pre-defined, user-modifiable application tests
  • Automatically save data to hard disk drive or any networked drive
  • Offline data analysis and application test development via Desktop EasyEXPERT software


General features of B2200A

 8 guarded triaxial inputs and 6 coaxial inputs with up to 48 guarded triaxial outputs.


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The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.


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