Macquarie Semiconductor and Technology on behalf of Micron Japan, Ltd.
Automated Test Equipment (ATE)
Date of Manufacture:
Currently Configured for: N/A
Current Equipment Status: Available
Asset HDD not included
Location of Equipment: Hiroshima, Japan
Available date: Currently Available
PROBE 15-3ADV_5377S_TST
CONFIGURATION OF TEST HEAD
PIN CONFIGURATION 2048DR+1280I/O(FULL)
CONFIGURATION OF DPU
DC CONFIGURATION [1-128] ..........> 1-128
PPS CONFIGURATION [1-256] ..........> 1-256
AC FREQUENCY (Hz) [50,60] ........................> 60
CONFIGURATION OF FTU
FLASH OPTION [Y,N] ...........................> NO
CONFIGURATION OF FM
NUMBER OF FMRA BOARD [0-8] ...........................> 8
SIZE OF FMRA BOARD [1:8G,2:16G,3:32G] ..............> 3
PM(PATTERN MEMORY) BOARD EXIST [Y,N] .................> NO
CONFIGURATION OF MRA
MRA4 EXIST [Y,N] .....................................> YES
RCPU STN1 A-D EXIST [Y,N] .......................> YES
RCPU STN1 E-H EXIST [Y,N] .......................> YES
Tool has been de-installed and is stored in an off-site warehouse.
A Hard Disk Drive will be removed from tool.
Other missing or damaged parts: Not reported.
No pictures provided: Please inspect to collect photos.
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
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