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JEOL JSM-6400F

Asset ID: 210857

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JEOL

JSM-6400F

FE SEM

Metrology Equipment

Equipment details:

Date of Manufacture:

Currently Configured for: To be determined

Current Equipment Status: Available

Location of Equipment: Yorktown Heights, United States

Available date: Currently Available

 Manufacturer: JEOL Ltd

 Model: JSM-6400F Scanning Electron Microscope (SEM)

 Serial number: SM160017-49

                   

The JEOL JSM-6400F is a scanning electron microscope with a field emission gun and maximum accelerating voltage of 30 keV. non-operational

           

Original date of purchase or date of mfg: circa 2001

Last Date Operated: approx 2010

 

=========================REFERENCE=================================

JEOL JSM 6400F Feature

1)Resolution: 1.5 nm at 30 kV and at 8 mm WD

2)Magnification: 10x to 500 000x

3)Probe current: 10 x 10-12 to 10 x 10-10 A

4)Electron gun: Cold-cathode field emission

5)Detectors: Scinitillator/photomultiplier

6)GW electronic system 47 backscattered detector

7)Accelerating Voltage: 500V to 30 kV

8)Specimen stage: fully eucentric goniometer stage

a)Movements: x = 100 mm; y= 110 mm; z = 34 mm

b)Tilt: -5 deg. to 60 deg.

c)Rotation: 360 deg. endless

9)Specimen exchange: by airlock: up to 150 mm dia. Specimen holder

10)By stage drawout: 200 mm dia. Or larger specimen holders

11)EDS detector: Si(Li) (30mm2) Prism 2000 with Imix acquisition system allowing Be detection

12)EBSD detector: Oxford HKL allowing crystallographic orientation

Product images

The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.


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