Macquarie Semiconductor and Technology on behalf of Micron Memory Japan, K.K. (F15)
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Date of Manufacture:
Currently Configured for: 300mm
Current Equipment Status: Available
Asset HDD not included
Location of Equipment: Hiroshima, Japan
Available date: Currently Available
Tool used to be connected to a UF3000 prober.
DIAG Data is available for review. Please check with your sales person.
No missing/damaged parts and no modifications.
No puls generator.
No LCR Meter, HSCU (High speed capacitance measurement unit is equipped inside Test Head.
WorkStation: C3750. License key is included in tool for sale.
================= The below is OEM Feature for reference ====================
The 4073B Ultra Advanced Parametric Tester enables semiconductor manufacturers to dramatically reduce test time for capacitance measurements and DC measurements in high-volume semiconductor wafer manufacturing processes. It offers up to 40 percent higher throughput than the 4073A or 4072A. The 4073B is a flexible test solution. It performs precise DC measurements, capacitance measurements, flash memory cell testing, and testing of other high-frequency applications.
2 microvolt and 1 femtoamp measurement resolution (HRSMU)
+/- 200 Volts and +/- 1 Amp output capability (HPSMU)
1 kHz to 2 MHz capacitance frequency measurement range (HSCMU)
+/- 1.6 Amp ground unit (GNDU)
HV-SPGU option measurement capabilities
+/-40 V output (80 V peak-to-peak) at high impedance
Pulse rise and fall times as fast as 20 ns
Three-level output pulse capability
Arbitrary Linear Waveform Generation (ALWG) function
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
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