Macquarie Semiconductor and Technology on behalf of Micron Technology, Inc. (Boise)
Automated Test Equipment (ATE)
Date of Manufacture: 2003
Currently Configured for: N/A
Current Equipment Status: Available
Location of Equipment: Boise, United States
Available date: Currently Available
System is deinstalled, in storage.
Includes one (1) test head and chiller.
Audit to verify.
Feature
•36 Site, 2304 Channel Configuration
•100 MHz Data Rate
•<1.0ns Overall Timing Accuracy
•4K Pattern Memory Depth
•384Mb Error Capture/Buffer Memory
•System is deinstalled and available for inspection
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
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