Macquarie Semiconductor and Technology on behalf of Micron Technology, Inc. (VA)
Automated Test Equipment (ATE)
Date of Manufacture:
Currently Configured for: 300mm
Current Equipment Status: Available
Asset HDD not included
Location of Equipment: Manassas, United States
Available date: Currently Available
No pictures provided. Please inspect to confirm.
Other Missing or damaged parts: Not reported. Please inspect to confirm.
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T5585 Memory Test System, designed for high-volume package production of memory such as DDR-SDRAM and SSRAM, with high precision testing of up to 128 devices in parallel.
Capable of testing 500 MHz Double Data Rate (DDR) in a single pass, the T5585 also incorporates the latest technology in accuracy, stability, and reliability.
By doubling the test-cell capacity of the T5581, which is Advantest's record-setting production tester, the T5585 joins production efficiency with next-generation performance for high-volume memory test.
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
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