Macquarie Semiconductor and Technology on behalf of Micron Technology Taiwan, Inc. (F11)
Date of Manufacture:
Currently Configured for: 300mm
Current Equipment Status: Available
Asset HDD not included
Location of Equipment: Taoyuan, Taiwan
Available date: Currently Available
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Ultra Advanced Parametric Tester. Enables semiconductor manufacturers to dramatically reduce test time for capacitance measurements and DC measurements in high-volume semiconductor wafer manufacturing processes. It offers up to 40 percent higher throughput than the 4073A or 4072A. The 4072B is a flexible test solution. It performs precise DC measurements, capacitance measurements, flash memory cell testing, and testing of other high-frequency applications.
Supports up to 2xHPSMU and up to 8 total SMUs
Low-leakage switching matrix, customizable from 12 to 48 fully-guarded Kelvin outputs
High-frequency switching matrix with integrated pulse generator control
8 auxiliary inputs and 48 extended path inputs for support of external instruments
2 microvolt and 10 femtoamp measurement resolution (MPSMU and HPSMU)
+/- 200 Volts and +/- 1 Amp output capability (HPSMU)
1 kHz to 2 MHz capacitance frequency measurement range (HSCMU)
+/- 1.6 Amp ground unit (GNDU) HV-SPGU option measurement capabilities
+/-40 V output (80 V peak-to-peak) at high impedance
Pulse rise and fall times as fast as 20 ns
Three-level output pulse capability
Arbitrary Linear Waveform Generation (ALWG) function
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
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