Macquarie Semiconductor and Technology on behalf of Micron Technology Taiwan, Inc. (F11)

Keysight / Agilent / Hewlett-Packard (HP) 4072B

Asset ID: 211269

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Keysight / Agilent / Hewlett-Packard (HP)

4072B

Parametric Tester

Automated Test Equipment (ATE)

Equipment details:

Date of Manufacture:

Currently Configured for: 300mm

Current Equipment Status: Available

Asset HDD not included

Location of Equipment: Taoyuan, Taiwan

Available date: Currently Available

A-211266 prober & A-211269 tester are packed & crated together

Tool config is based on original PO, please verify tool details at tool inspection


Parametric Pins (quantity): 32


Testhead Subsystem

DVM - HP3458A Dig Multimeter: MY45041821

CMU - HP4284A LCR Meter: NA

CMU - HP4980A LCR Meter: NA

Additional: NA

PGU - Agilent 81110A(quantity/slots): NA

PGU - Agilent 8114A(quantity/slots): NA

Testhead (quantity): 1


DC Sources

HPSMU (quantity/slots): 1

MPSMU (quantity/slots): 5

HSCMU (quantity/slots): 1


Outer Ports

DVMH: Y

DVML: Y

CMH: Y

CML: Y


Controller

HP C3750 (or other): C8000

System Password: WAT


Software 

SPECS Software Version: SPECS-3.10

OS: HPUX-11.11i


Interfaces

E3121A board: Y

GPIB: Y

RS232: Y

Ethernet: Y

Operational (Y/N): Y

Overall Condition (good, fair, poor): good


Damage/Missing parts list

Please inspect tool to reconfirm

Dry pumps and customer provided items not included on sales


Agilent 4072B

Ultra Advanced Parametric Tester. Enables semiconductor manufacturers to dramatically reduce test time for capacitance measurements and DC measurements in high-volume semiconductor wafer manufacturing processes. It offers up to 40 percent higher throughput than the 4073A or 4072A. The 4072B is a flexible test solution. It performs precise DC measurements, capacitance measurements, flash memory cell testing, and testing of other high-frequency applications.

Supports up to 2xHPSMU and up to 8 total SMUs

Low-leakage switching matrix, customizable from 12 to 48 fully-guarded Kelvin outputs

High-frequency switching matrix with integrated pulse generator control

8 auxiliary inputs and 48 extended path inputs for support of external instruments

2 microvolt and 10 femtoamp measurement resolution (MPSMU and HPSMU)

+/- 200 Volts and +/- 1 Amp output capability (HPSMU)

1 kHz to 2 MHz capacitance frequency measurement range (HSCMU)

+/- 1.6 Amp ground unit (GNDU) HV-SPGU option measurement capabilities

+/-40 V output (80 V peak-to-peak) at high impedance

Pulse rise and fall times as fast as 20 ns

Three-level output pulse capability

Arbitrary Linear Waveform Generation (ALWG) function

Product images

The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.


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