Macquarie Semiconductor and Technology on behalf of Micron Memory Japan, G.K. (F15)
Date of Manufacture:
Currently Configured for: To be determined
Current Equipment Status: Available
Asset HDD not included
Location of Equipment: Hiroshima, Japan
Available date: Currently Available
PROBE 15-3NIK_ECLIPSE_L300_01 NIKON ECLIPSE L300
Tool has been de-installed and is stored in an off-site warehouse.
No photos provided. Please inspect to collect photos.
Missing or damaged parts: Checking with FAb15.
NIKON Eclipse L300N Series – FPD/LSI inspection microscopes
Episcopic illuminator : 12V-50W halogen lamp light source built in
Focusing mechanism : Cross travel: 29 mm / Coarse: 12.7 mm per rotation (torque adjustable, refocusing mechanism provided) / Fine: 0.1 mm per rotation (in 1 µm increments)
Stages : 14 x 12 stage, stroke: 354 x 302 mm (Diascopic observation range: 354 x 268 mm) / Coarse/Fine-movement changeover possible / Fixed-position X-Y fine-movement controls
Antistatic mechanism : 1000-10 V, within 0.2 sec
Power consumption : 1.2 A/90 W
Dimensions : Approx. 360 (W) x 951 (D) x 581 (H) mm (at tilt angle 10°)
Weight : Approx. 64 kg (When L2-S8A 8 x 8 stage and L2-TTA eyepiece tube are used)
The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.
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