Macquarie Semiconductor and Technology on behalf of Micron Memory Japan, G.K. (F15)

Accretech/TSK UF3000

Asset ID: 40094

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Accretech/TSK

UF3000

Production Wafer Prober

Wafer Prober

Equipment details:

Date of Manufacture: November, 2006

Currently Configured for: 300mm

Current Equipment Status: Available

Asset HDD not included

Location of Equipment: Hiroshima, Japan

Available date: 9/3/2022

Tool is operating in clean room.

Shipping brackets and kits will need to be supplied by buyer.

Missing or damaged parts: Fab15 confirmed there were no missing or damaged parts.


UPDATED CONFIGURATION:


Connected with an Agilent 4073B tester.

Temperature range: 40℃~150℃

Configured for Ambient/Hot temperatures. 

To operate up to 150℃.

Chuck Type: Low Noise Chuck.

Chuck MFG: NOV-06.

Tester Interface: Connected on GP-IB between Prober and Tester.

Tool corresponds with Tester on GP-IB.


Prober Feature

X,Y Overall Accuracy:±2.0µm (Temp Stability ±1℃

X,Y Stage Accuracy:±1.0µm

Z Axis Stroke(Applicable stroke):37mm

Z Axis Control Accuracy:±2µm

Stage Durability:200kgf


Prober Feature

X,Y Overall Accuracy:±2.0µm (Temp Stability ±1℃

X,Y Stage Accuracy:±1.0µm

Z Axis Stroke(Applicable stroke):37mm

Z Axis Control Accuracy:±2µm

Stage Durability:200kgf

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The information referenced on this page is accurate to the best of our knowledge. We do not warrant the completeness or accuracy of the information contained herein. Interested parties are encouraged to request inspection to verify equipment condition, configuration, and completeness. Any offer to purchase equipment shall be subject to our standard terms and conditions of sale.


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