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You are here:   Macquarie Electronics > Equipment availability > KLA-Tencor 2132 Wafer Defect Inspection System

KLA-Tencor 2132 Wafer Defect Inspection System
  • Configurable for 100mm-200mm Wafer Sizes
  • Currently Configured for 150mm
  • Original Manufacture Date: March, 1996
  • Includes KLA 2552 Data Analysis System
  • Automatic Defect Classification (ADC)
  • Die-to-Die Sensitivity: 0.60mm, 0.40mm, 0.25mm
  • Die-to-Die Speed: 5 sec/cm2, 15 sec/cm2, 30 sec/cm2
  • Cell-to-Cell Sensitivity: 0.50mm, 0.30mm, 0.20mm
  • Cell-to-Cell Speed: 1.5 sec/cm2, 5 sec/cm2, 15 sec/cm2
  • 120VAC, 25A, 50/60Hz
  • Pacific Power Control, Inc: Power Line Conditioner

All equipment is offered subject to prior sale.  This item will be quoted based upon specific configuration, terms and configuration required.

Interested parties may contact Matt Hayes at Macquarie Electronics for additional information at (408) 973 7842.
  Important Information
© 2002-2007 Macquarie Group
 

Other than Macquarie Bank Limited ABN 46 008 583 542 (MBL), any Macquarie Group entity noted on this page is not an authorised deposit-taking institution for the purposes of the Banking Act 1959 (Commonwealth of Australia). That entity's obligations do not represent deposits or other liabilities of MBL. MBL does not guarantee or otherwise provide assurance in respect of the obligations of that entity, unless noted otherwise.

Macquarie Capital (Europe) Limited is incorporated and registered as a private limited company in England and Wales with company number 03704031. Registered office is located at Level 30, CityPoint, 1 Ropemaker Street, London, EC2Y 9HD. Macquarie Capital (Europe) Limited is authorised and regulated by the Financial Services Authority (Firm No.193905).